1.Gao X, Zhang Y, Xiang Y,Li P*, Liu X. An interface reconstruction method based on the physics-informed neural network: application to ultrasonic array imaging.IEEE Transactions on Instrumentation and Measurement, 2025, 74: 1-8.

2.Qiang Z,Li P*, Wu B, Wang N, Wang Y, Li G, Liu X. Direct observation of magnetic barkhausen noise around grain boundaries with high-spatial-resolution magnetic barkhausen noise sensor.Measurement Science and Technology, 2024, 36(2): 25101.

3.Wang N,Li P*, Li T, Wang Y, He C, Liu X. Quantitative characterization of tensile stress in electroplated nickel coatings with a magnetic incremental permeability sensor.Sensors and Actuators a: Physical, 2024, 368: 115082.

4.Li P*, Shao Y, Xu K, Liu X. High-speed multiparametric imaging through off-resonance tapping AFM with active probe.Ultramicroscopy, 2023, 248: 113712.

5.Li P*, Wang X, Ding D, Gao Z, Fang W, Zhang C, He C, Liu X. Surface Decarburization Depth Detection in Rods of 60Si2Mn Steel with Magnetic Barkhausen Noise Technique.Sensors, 2023, 23(1): 503.

6.Li P*, Li G. Advances in Scanning Ion Conductance Microscopy: Principles and Applications.Ieee Nanotechnology Magazine, 2021, 15(1): 17-25.

7.Li P*, Shao Y, Xu K, Qiu X. Development of a multi-functional multi-probe atomic force microscope system with optical beam deflection method.Review of Scientific Instruments, 2021, 92(12): 123705.

8.Zhang G,Li P*, Wei D, Hu K, Qiu X. Lateral force calibration for atomic force microscope cantilevers using a suspended nanowire.Nanotechnology, 2020, 31(47): 475703.

9.闫孝姮,孔繁会,邵永健,李鹏*.非共振轻敲模式原子力显微镜的研究.仪器仪表学报, 2020, 41(02): 70-77.

10.He X,Li P*, Liu P, Zhang X, Zhou X, Liu W, Qiu X. Nanopatterning on calixarene thin films via low-energy field-emission scanning probe lithography.Nanotechnology, 2018, 29(32): 325301.

11.许可,邵永健,李鹏*,裘晓辉.多探针扫描探针显微镜研究进展与应用.科学通报, 2018, 63(35): 3713-3726.

12.Xu K, Sun W, Shao Y, Wei F, Zhang X, Wang W,Li P*. Recent development of PeakForce Tapping mode atomic force microscopy and its applications on nanoscience.Nanotechnology reviews, 2018, 7(6): 605-621.

13.Li P*, Liu L, Yang Y, Wang Y, Li G. In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation.IEEE Transactions On Industrial Electronics, 2015, 62(10): 6508-6518.

14.Li P*, Liu L, Yang Y, Zhou L, Wang D, Wang Y, Li G. Amplitude Modulation Mode of Scanning Ion Conductance Microscopy.Journal of Laboratory Automation, 2015, 20(4): 457-462.

15.Li P*, Liu L, Wang Y, Yang Y, Zhang C, Li G. Phase modulation mode of scanning ion conductance microscopy.Applied Physics Letters, 2014, 105(5): 53113.