期刊论文
1.X Yan,J Su*, B Wu, Y Liu, J Deng, Y Xie, Study of SiO2/ZnS-based broadband mirror vertical cavity surface emitting laser,Infrared and Laser Engineering, vol. 54, no. 7, p.20250059, Jul. 2025.
2.J Su*, Y Ma, X Mu, X Yan, Y Xie, Highly smooth and transparent p-type conducting CuI thin film deposited by sputtering,J. Mater. Sci. Mater. Electron., vol. 36, no. 15, pp. 1-7, May. 2025.
3.S Du,J Su*, H Zhou, H Zhang, P Qiu, J Deng, Q Kan and Y Xie, Impact of Oxide Aperture on the Static and Dynamic Performance of 850-nm VCSELs,IEEE Photonics Technol. Lett.,vol. 36, no. 24, pp. 1453-1456, Dec. 2024.
4.J Su, H Yang, W Yang, X Zhang, Electrical characteristics of tungsten doped InZnSnO thin film transistors by RF magnetron sputtering,J. Vac. Sci. Technol. B, vol. 40, no. p. 032201, May. 2022.
5.J Su, H Yang, Y Ma, R Li, L Jia, D Liu, X Zhang, Annealing atmosphere-dependent electrical characteristics and bias stability of N-doped InZnSnO thin film transistors,Mater. Sci. Semicond. Process., vol. 113C, p. 105040, Jul. 2020.
6.J Su, R Li, Y Ma, S Dai, Y Wang, H Yang, X Zhang,Annealing temperature effects on the structural and electrical properties of N-doped In-Zn-Sn-O thin film transistors,J. Alloy. Compd., vol. 801, pp. 33-39, Sep. 2019.
7.J Su, Q Wang, Y Ma, R Li, S Dai, Y Wang, H Yang, X Zhang, Amorphous InZnO: Li/ZnSnO: Li dual-active-layer thin film transistors,Mater. Res. Bull., vol. 111, pp. 165-169, Mar. 2019.
8.J Su, Y Ma, H Yang, R Li, L Jia, D Liu, X Zhang, Electrical characteristics of Li and N co-doped amorphous InZnSnO thin film transistors,J. Vac. Sci. Technol. A, vol. 37, no. 6, p. 061511, Nov. 2019.
9.J Su, Y Wang, Y Ma, Q Wang, L Tian, S Dai, R Li, X Zhang, Y Wang, Preparation and electrical characteristics of N-doped In-Zn-Sn-O thin film transistors by radio frequency magnetron sputtering,J. Alloy. Compd., vol. 750, pp. 1003-1006, Jun. 2018.
10.H Yang, W Yang,J Su, X Zhang,Preparation and electrical characteristics of transparent thin film transistors with sputtered aluminum and phosphorus co-doped indium-zinc-oxide channel layer,Solid-State Electron., vol. 208, p. 108725, Oct. 2023.